OS GSO IEC 60749-1:2014

IEC 60749-1:2002
Omani Standard   Current Edition · Approved on 25 December 2014

Semiconductor devices - Mechanical and climatic test methods - Part 1: General

OS GSO IEC 60749-1:2014 Files

English 15 Pages
Current Edition Reference Language

OS GSO IEC 60749-1:2014 Scope

This part of IEC 60749 is applicable to semiconductor devices (discrete devices and integrated circuits) and establishes provisions common to all the other parts of the series. In the case of contradiction between this standard and a relevant procurement specification, the latter should govern.

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